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Position: Chinese Standard in English/GB/T 17169-1997
GB/T 17169-1997   Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection (English Version)
Standard No.: GB/T 17169-1997 Status:abolished
Language:English File Format:PDF
Word Count: 4500 words Price(USD):380.00 remind me the price change
Implemented on:1998-8-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 17169-1997
English Name: Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection
Chinese Name: 硅抛光片和外延片表面质量光反射测试方法
Chinese Classification: H24    Metallographic testing method
Professional Classification: GB    National Standard
ICS Classification: 29.045 29.045    Semiconducting materials 29.045
Issued by: SBTS
Issued on: 1997-01-02
Implemented on: 1998-8-1
Status: abolished
Abolished on:2005-10-14
Language: English
File Format: PDF
Word Count: 4500 words
Price(USD): 380.00
Delivery: via email in 1~3 business day
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