Code of China Chinese Classification Professional Classification ICS Classification Latest Value-added Services

LoginRegister
GB/T 17169-1997   Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection (English Version)
Standard No.: GB/T 17169-1997 Status:abolished remind me the status change
Language:English File Format:PDF
Word Count: 4500 words Price(USD):380.0 remind me the price change
Implemented on:1998-8-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 17169-1997
English Name: Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection
Chinese Name: 硅抛光片和外延片表面质量光反射测试方法
Chinese Classification: H24    Metallographic testing method
Professional Classification: GB    National Standard
ICS Classification: 29.045 29.045    Semiconducting materials 29.045
Issued by: SBTS
Issued on: 1997-01-02
Implemented on: 1998-8-1
Status: abolished
Abolished on:2005-10-14
Language: English
File Format: PDF
Word Count: 4500 words
Price(USD): 380.0
Delivery: via email in 1~3 business day
Contact Us
Tel: +86-10-8572 5655
Fax: +86-10-8581 9515
Email: coc@codeofchina.com
QQ: 672269886
About Us   |    Contact Us   |    Terms of Service   |    Privacy   |    Cancellation & Refund Policy   |    Payment
Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886
Copyright: TransForyou(Beijing) Translation Co., Ltd. 2008-2020
 
 
Keywords:
GB/T 17169-1997, GB 17169-1997, GBT 17169-1997, GB/T17169-1997, GB/T 17169, GB/T17169, GB17169-1997, GB 17169, GB17169, GBT17169-1997, GBT 17169, GBT17169