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GB/T 17473.2-1998   Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness (English Version)
Standard No.: GB/T 17473.2-1998 Status:abolished remind me the status change
Language:English File Format:PDF
Word Count: 2000 words Price(USD):60.0 remind me the price change
Implemented on:1999-3-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 17473.2-1998
English Name: Test methods of precious metal pastes used for thick film microelectronics--Determination of fineness
Chinese Name: 厚膜微电子技术用贵金属浆料测试方法 细度测定
Chinese Classification: H21    Metal physical property test method
Professional Classification: GB    National Standard
ICS Classification: 77.040.01 77.040.01    Testing of metals in general 77.040.01
Issued by: State Qualtiy Technical Supervision Bureau
Issued on: 1998-08-19
Implemented on: 1999-3-1
Status: abolished
Superseded by:GB/T 17473.2-2008 Test methods of presious metals pastes used for microelectronics - Determination of fineness
Superseded on:2008-9-1
Abolished on:2008-09-01
Language: English
File Format: PDF
Word Count: 2000 words
Price(USD): 60.0
Delivery: via email in 1~3 business day
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