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GB/T 20176-2006   Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials (English Version)
Standard No.: GB/T 20176-2006 Status:valid remind me the status change
Language:English File Format:PDF
Word Count: 8000 words Price(USD):230.0 remind me the price change
Implemented on:2006-11-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 20176-2006
English Name: Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials
Chinese Name: 表面化学分析 二次离子质谱 用均匀掺杂物质测定硅中硼的原子浓度
Chinese Classification: N33    Electron optics and other physical optics instrument
Professional Classification: GB    National Standard
Issued by: SAC
Issued on: 2006-03-27
Implemented on: 2006-11-1
Status: valid
Language: English
File Format: PDF
Word Count: 8000 words
Price(USD): 230.0
Delivery: via email in 1~3 business day
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