GB/T 33236-2016 English Version, GB/T 33236-2016 Polycrystalline silicon―Determination of trace elements―Glow discharge mass spectrometry method (English Version)

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GB/T 33236-2016 Polycrystalline silicon―Determination of trace elements―Glow discharge mass spectrometry method (English Version)
Standard No.:	GB/T 33236-2016	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	7500 words	Translation Price(USD):	220.0 remind me the price change Email:
Implemented on:	2017-11-1	Delivery:	via email in 1~3 business day

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Standard No.:	GB/T 33236-2016
English Name:	Polycrystalline silicon―Determination of trace elements―Glow discharge mass spectrometry method
Chinese Name:	多晶硅痕量元素化学分析辉光放电质谱法
Chinese Classification:	G04 Basic standards and general methods
Professional Classification:	GB National Standard
ICS Classification:	71.040.40 71.040.40 Chemical analysis 71.040.40
Source Content Issued by:	AQSIQ;SAC
Issued on:	2016-12-13
Implemented on:	2017-11-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	7500 words
Translation Price(USD):	220.0
Delivery:	via email in 1~3 business day

Standard

GB/T 33236-2016 Polycrystalline silicon―Determination of trace elements―Glow discharge mass spectrometry method (English Version)
Standard No.	GB/T 33236-2016
Status	valid
Language	English
File Format	PDF
Word Count	7500 words
Price(USD)	220.0
Implemented on	2017-11-1
Delivery	via email in 1~3 business day

Detail of GB/T 33236-2016

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Introduction of GB/T 33236-2016

本标准规定了采用辉光放电质谱(GD?MS)法测量多晶硅中杂质元素的测试方法。?本标准适用于多晶硅材料中除氢和惰性气体元素以外的其他杂质元素含量的测定，测量范围是本方法的检出限至0.1%（质量分数)，检出限根据所用仪器及测量条件确定。通过合适的标准样品校正，也可以测量质量分数大于0.1%的杂质元素含量。单晶硅材料中痕量杂质元素也可参照本标准测量。?

Contents of GB/T 33236-2016

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Keywords:
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