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| Position: Chinese Standard in English/GB/T 34326-2017 |
| GB/T 34326-2017 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS (English Version) | |||
| Standard No.: | GB/T 34326-2017 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 8500 words | Price(USD): | 250.00 remind me the price change |
| Implemented on: | 2018-8-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 34326-2017 |
| English Name: | Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS |
| Chinese Name: | 表面化学分析 深度剖析 AES和XPS深度剖析时离子束对准方法及其束流或束流密度测量方法 |
| Chinese Classification: | G04 Basic standards and general methods |
| Professional Classification: | GB National Standard |
| ICS Classification: | 71.040.40 Chemical analysis |
| Issued by: | AQSIQ; SAC |
| Issued on: | 2017-09-29 |
| Implemented on: | 2018-8-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 8500 words |
| Price(USD): | 250.00 |
| Delivery: | via email in 1~3 business day |