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| Position: Chinese Standard in English/GB/T 37049-2018 |
| GB/T 37049-2018 Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method (English Version) | |||
| Standard No.: | GB/T 37049-2018 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5500 words | Translation Price(USD): | 165.0 remind me the price change |
| Implemented on: | 2019-4-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 37049-2018 |
| English Name: | Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method |
| Chinese Name: | 电子级多晶硅中基体金属杂质含量的测定 电感耦合等离子体质谱法 |
| Chinese Classification: | H17 Semimetal and semiconductor material analysis method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 77.040.30 Chemical analysis of metals |
| Source Content Issued by: | SAMR; SAC |
| Implemented on: | 2019-4-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 5500 words |
| Translation Price(USD): | 165.0 |
| Delivery: | via email in 1~3 business day |