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| Position: Chinese Standard in English/GB/T 47239.9-2026 |
| GB/T 47239.9-2026 Semiconductor devices—Flexible and stretchable semiconductor devices—Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells (English Version) | |||
| Standard No.: | GB/T 47239.9-2026 | Status: | to be valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 10500 words | Translation Price(USD): | 315.0 remind me the price change |
| Implemented on: | 2026-9-1 | Delivery: | via email in 1~5 business day |
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| Standard No.: | GB/T 47239.9-2026 |
| English Name: | Semiconductor devices—Flexible and stretchable semiconductor devices—Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells |
| Chinese Name: | 半导体器件 柔性可拉伸半导体器件 第9部分：一晶体管一电阻式（1T1R）电阻存储单元性能测试方法 |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | SAMR; SAC |
| Issued on: | 2026-02-27 |
| Implemented on: | 2026-9-1 |
| Status: | to be valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 10500 words |
| Translation Price(USD): | 315.0 |
| Delivery: | via email in 1~5 business day |
