Standard No.:	GB/T 5201-1994
English Name:	Test procedures for semiconductor charged particle detectors
Chinese Name:	带电粒子半导体探测器测试方法
Chinese Classification:	F80    Nuclear instrument and detector in general
Professional Classification:	GB    National Standard
Issued by:	AQSIQ
Issued on:	1994-1-2
Implemented on:	1995-10-1
Status:	superseded
Superseded by:	GB/T 5201-2012 GB/T 5201-2012
Superseded on:	2012-11-1
Superseding:	GB 5201-1985 Test procedures for semiconductor charged particle detectors
Language:	English
File Format:	PDF
Word Count:	7000 words
Price(USD):	210.00
Delivery:	via email in 1~3 business day

本标准规定了带电粒子半导体探测器电特性和核辐射性能的测试方法以及某些特殊环境的试验方法。本标准适用于探测带电粒子的部分耗尽金硅面垒型、锂漂移金硅面垒型和表面钝化离子注入平面硅型等半导体探测器。全耗尽金硅面垒型探测器的某些性能测试也应参照本标准执行。