GB/T 5201-2012 English Version, GB/T 5201-2012 Test procedures for semiconductor charged particle detectors (English Version)

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GB/T 5201-2012 Test procedures for semiconductor charged particle detectors (English Version)
Standard No.:	GB/T 5201-2012	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	9000 words	Translation Price(USD):	260.0 remind me the price change Email:
Implemented on:	2012-11-1	Delivery:	via email in 1~3 business day

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Standard No.:	GB/T 5201-2012
English Name:	Test procedures for semiconductor charged particle detectors
Chinese Name:	带电粒子半导体探测器测量方法
Chinese Classification:	F88 Nuclear detector
Professional Classification:	GB National Standard
Source Content Issued by:	AQSIQ;SAC
Issued on:	2012-6-29
Implemented on:	2012-11-1
Status:	valid
Superseding:	GB/T 5201-1994 Test procedures for semiconductor charged particle detectors
Target Language:	English
File Format:	PDF
Word Count:	9000 words
Translation Price(USD):	260.0
Delivery:	via email in 1~3 business day

Standard

GB/T 5201-2012 Test procedures for semiconductor charged particle detectors (English Version)
Standard No.	GB/T 5201-2012
Status	valid
Language	English
File Format	PDF
Word Count	9000 words
Price(USD)	260.0
Implemented on	2012-11-1
Delivery	via email in 1~3 business day

Detail of GB/T 5201-2012

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ICS Classification

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Introduction of GB/T 5201-2012

本标准规定了带电粒子半导体探测器的电特性和核辐射性能的测量方法以及某些特殊环境的试验方法。
本标准适用于带电粒子部分耗尽层的半导体探测器。
全耗尽型半导体探测器的测量可参照本标准执行。

Contents of GB/T 5201-2012

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