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| Position: Chinese Standard in English/GB/T 6618-1995 |
| GB/T 6618-1995 Test method for thickness and total thickness variation of silicon slices (English Version) | |||
| Standard No.: | GB/T 6618-1995 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 4000 words | Translation Price(USD): | 340.0 remind me the price change |
| Implemented on: | 1995-1-2 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 6618-1995 |
| English Name: | Test method for thickness and total thickness variation of silicon slices |
| Chinese Name: | 硅片厚度和总厚度变化测试方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | China State Bureau of Technical Supervision |
| Issued on: | 1995-04-18 |
| Implemented on: | 1995-1-2 |
| Status: | superseded |
| Superseded by: | GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices |
| Superseded on: | 2010-6-1 |
| Abolished on: | 2010-06-01 |
| Superseding: | GB 6618-1986 Standard method for measuring thickness and total thickness variation of silicon slices |
| Target Language: | English |
| File Format: | |
| Word Count: | 4000 words |
| Translation Price(USD): | 340.0 |
| Delivery: | via email in 1~3 business day |