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| Position: Chinese Standard in English/SJ 20954-2006 |
| SJ 20954-2006 Integrated circuits latch-up test (English Version) | |||
| Standard No.: | SJ 20954-2006 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 7500 words | Translation Price(USD): | 220.0 remind me the price change |
| Implemented on: | 2006-12-30 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ 20954-2006 |
| English Name: | Integrated circuits latch-up test |
| Chinese Name: | 集成电路锁定试验 |
| Chinese Classification: | L55 Microcircuit in general |
| Professional Classification: | SJ Professional Standard - Electronics |
| ICS Classification: | 31.2 Integrated circuits. Microelectronics |
| Source Content Issued by: | MOII |
| Issued on: | 2006-8-7 |
| Implemented on: | 2006-12-30 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 7500 words |
| Translation Price(USD): | 220.0 |
| Delivery: | via email in 1~3 business day |