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| Position: Chinese Standard in English/undefinedGB/T 14863-1993 |
| undefinedGB/T 14863-1993 (English Version) | |||
| Standard No.: | undefinedGB/T 14863-1993 | Status: | superseded |
| Language: | English | File Format: | |
| Word Count: | Price(USD): | remind me the price change | |
| Implemented on: | Delivery: | ||
| Standard No.: | undefinedGB/T 14863-1993 |
| Status: | superseded |
| Superseded by: | GB/T 14863-1993 test method for net carrier density in silicon epitaxial layers by voltage - Capacitance of gated and ungated diodes |
| Superseded on: | 1994-10-1 |
| Language: | English |
| File Format: |