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| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | Intelligent computing - Test method for memristor - Part 1: Basic characteristics |
| Chinese Title: | 智能计算 忆阻器测试方法 第1部分：基础特性 |
| Standard No.: | GB/T 46567.1-2025 |
| Category No.: | L40 |
| Issued by: | SAMR, SAC |
| Issued on: | 2025-10-31 |
| Implemented on: | 2025-10-31 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 8000 words |
| Similar Standards: |
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