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| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection(PIND) |
| Chinese Title: | 半导体器件 机械和气候试验方法 第16部分：粒子碰撞噪声检测（PIND） |
| Standard No.: | GB/T 4937.16-2025 |
| Category No.: | L40 |
| Issued by: | SAMR, SAC |
| Issued on: | 2025-10-31 |
| Implemented on: | 2026-5-1 |
| Status: | to be valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 9000 words |
| Similar Standards: |
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