2025-12-16 216.73.216.89
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 34900-2017 Micro-electromechanical system technology-Measuring method for residual strain measurements of MEMS microstructures using an optical interferometer 220.0 via email in 1~3 business day valid,,2018-5-1
GB/T 34899-2017 Micro-electromechanical system technology-Measuring method of microstructure surface stress based on Raman spectroscopy 220.0 via email in 1~3 business day valid,,2018-5-1
GB/T 34898-2017 Micro electromechanical system technology-Test method for the nonlinear vibration of the MEMS resonant sensitive element 225.0 via email in 1~3 business day valid,,2018-5-1
GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances 180.0 via email in 1~3 business day valid,,2018-2-1
GB/T 33929-2017 Test methods of the performance for MEMS high g accelerometer 220.0 via email in 1~3 business day valid,,2018-2-1
GB/T 32814-2016 Fabrication Technology of Silicon Based MEMS Process Specification Based on SOI Silicon 220.0 via email in 1~3 business day valid,,2017-3-1
GB/T 32815-2016 Silicon-based MEMS fabrication technology - Specification for criterion of the bulk silicon piezoresistance process 370.0 via email in 1~5 business day valid,,2017-3-1
GB/T 32816-2016 Silicon-based MEMS manufacturing technology to deep etch and bonding as the core of the process integration specification 250.0 via email in 1~3 business day valid,,2017-3-1
GB/T 32817-2016 Semiconductor devices - Micro-electromechanical devices - Generic specification for MEMS 310.0 via email in 1~5 business day valid,,2017-3-1
DB44/T 1905-2016 Test methods for Ultra-High Frequency radio frequency identification chips via email in business day abolished2025-08-31,,2016-12-29
GB/T 20296-2012 Mnemonics and symbols for integrated circuits 450.0 via email in 1~3 business day valid,,2013-7-1
GB/T 28276-2012 Silicon-based MEMS fabrication technology—Specification for dissolved wafer process 210.0 via email in 1~3 business day valid,,2012-12-1
GB/T 28275-2012 Silicon-based MEMS fabrication technology—Specification for KOH etch process 180.0 via email in 1~3 business day valid,,2012-12-1
GB/T 28274-2012 Silicon-based MEMS fabrication technology—The basic regulation of layout design 210.0 via email in 1~3 business day valid,,2012-12-1
GB/T 28277-2012 Silicon-based MEMS fabrication technology—Measurement method of cutting and pull-press strength of micro bonding area 330.0 via email in 1~3 business day valid,,2012-12-1
GB/T 26111-2010 Micro-electromechanical system technology—Terms 570.0 via email in 1~3 business day superseded,2023-9-1,2011-10-1
GB/T 26112-2010 Micro-electromechanical system technology—General rules for the assessment of micro-mechanical parameters 240.0 via email in 1~3 business day valid,,2011-10-1
GB/T 26113-2010 Micro-electromechanical system technology—General rules for the assessment of micro-geometrical parameters 130.0 via email in 1~3 business day valid,,2011-7-1
SJ 20961-2006 General principles of measuring methods of A/D and D/A converters for integrated circuits 400.0 via email in 1~3 business day valid,,2006-12-30
SJ 20954-2006 Integrated circuits latch-up test 220.0 via email in 1~3 business day valid,,2006-12-30
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GB/T 34900-2017 Micro-electromechanical system technology-Measuring method for residual strain measurements of MEMS microstructures using an optical interferometer 
  Issued on: 2017-11-01   Price(USD): 220.0
GB/T 34899-2017 Micro-electromechanical system technology-Measuring method of microstructure surface stress based on Raman spectroscopy 
  Issued on: 2017-11-01   Price(USD): 220.0
GB/T 34898-2017 Micro electromechanical system technology-Test method for the nonlinear vibration of the MEMS resonant sensitive element 
  Issued on: 2017-11-01   Price(USD): 225.0
GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances 
  Issued on: 2017-07-12   Price(USD): 180.0
GB/T 33929-2017 Test methods of the performance for MEMS high g accelerometer 
  Issued on: 2017-07-12   Price(USD): 220.0
GB/T 32814-2016 Fabrication Technology of Silicon Based MEMS Process Specification Based on SOI Silicon 
  Issued on: 2016-08-29   Price(USD): 220.0
GB/T 32815-2016 Silicon-based MEMS fabrication technology - Specification for criterion of the bulk silicon piezoresistance process 
  Issued on: 2016-08-29   Price(USD): 370.0
GB/T 32816-2016 Silicon-based MEMS manufacturing technology to deep etch and bonding as the core of the process integration specification 
  Issued on: 2016-08-29   Price(USD): 250.0
GB/T 32817-2016 Semiconductor devices - Micro-electromechanical devices - Generic specification for MEMS 
  Issued on: 2016-08-29   Price(USD): 310.0
DB44/T 1905-2016 Test methods for Ultra-High Frequency radio frequency identification chips 
  Issued on: 2016-09-29   Price(USD):
GB/T 20296-2012 Mnemonics and symbols for integrated circuits 
  Issued on: 2012-12-31   Price(USD): 450.0
GB/T 28276-2012 Silicon-based MEMS fabrication technology—Specification for dissolved wafer process 
  Issued on: 2012-5-11   Price(USD): 210.0
GB/T 28275-2012 Silicon-based MEMS fabrication technology—Specification for KOH etch process 
  Issued on: 2012-5-11   Price(USD): 180.0
GB/T 28274-2012 Silicon-based MEMS fabrication technology—The basic regulation of layout design 
  Issued on: 2012-5-11   Price(USD): 210.0
GB/T 28277-2012 Silicon-based MEMS fabrication technology—Measurement method of cutting and pull-press strength of micro bonding area 
  Issued on: 2012-5-11   Price(USD): 330.0
GB/T 26111-2010 Micro-electromechanical system technology—Terms 
  Issued on: 2011-1-10   Price(USD): 570.0
GB/T 26112-2010 Micro-electromechanical system technology—General rules for the assessment of micro-mechanical parameters 
  Issued on: 2011-1-10   Price(USD): 240.0
GB/T 26113-2010 Micro-electromechanical system technology—General rules for the assessment of micro-geometrical parameters 
  Issued on: 2011-1-10   Price(USD): 130.0
SJ 20961-2006 General principles of measuring methods of A/D and D/A converters for integrated circuits 
  Issued on: 2006-8-7   Price(USD): 400.0
SJ 20954-2006 Integrated circuits latch-up test 
  Issued on: 2006-8-7   Price(USD): 220.0
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