Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe 150.0 via email in 1~3 business day valid
GB/T 24580-2009 Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry 180.0 via email in 1~3 business day valid
YS/T 985-2014 Polished reclaimed silicon wafers 225.0 via email in 1~3 business day valid
GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities 170.0 via email in 1~3 business day valid
GB/T 26069-2010 Specification for silicon annealed wafers 180.0 via email in 1~3 business day valid
GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay 210.0 via email in 1~3 business day valid
GB/T 6619-2009 Test methods for bow of silicon wafers 180.0 via email in 1~3 business day valid
GB/T 4061-2009 Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion 90.0 via email in 1~3 business day valid
GB/T 34479-2017 Specification for alphanumeric marking of silicon wafers 220.0 via email in 1~3 business day valid
GB/T 25076-2010 Monocrystalline silicon of solar cell 150.0 via email in 1~3 business day to be superseded
YS/T 23-1992 Thickness determination for silicon epitaxial layers - Stacking fault method 60.0 via email in 1~3 business day superseded
GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices 180.0 via email in 1~3 business day valid
GB/T 32279-2015 pecification for order entry format of silicon wafers 260.0 via email in 1~3 business day valid
GB/T 29505-2013 Test method for measuring surface roughness on planar surfaces of silicon wafer 430.0 via email in 1~3 business day valid
GB/T 30110-2013 Measuring Methods of Parameters of Hgcdte Epilayers Used for Space Infrared Detectors 480.0 via email in 1~3 business day valid
GB/T 6621-2009 Testing methods for surface flatness of silicon slices 110.0 via email in 1~3 business day valid
YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage 210.0 via email in 1~3 business day superseded
GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon 360.0 via email in 1~3 business day valid
GB/T 24577-2009 Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography 210.0 via email in 1~3 business day valid
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy 260.0 via email in 1~3 business day valid
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