Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon 360.0 via email in 1~3 business day valid
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy 260.0 via email in 1~3 business day valid
GB/T 1558-2009 Test method for substitutional atomic carbon concent of silicon by infrared absorption 150.0 via email in 1~3 business day valid
GB/T 14139-2009 Silicon epitaxial wafers 150.0 via email in 1~3 business day valid
GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices 180.0 via email in 1~3 business day valid
GB/T 24574-2009 Test methods for photoluminescence analysis of single crystal silicon for Ⅲ-Ⅴ impurities 210.0 via email in 1~3 business day valid
GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques 180.0 via email in 1~3 business day valid
GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry 120.0 via email in 1~3 business day valid
GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe 150.0 via email in 1~3 business day valid
GB/T 4061-2009 Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion 90.0 via email in 1~3 business day valid
GB/T 6621-2009 Testing methods for surface flatness of silicon slices 110.0 via email in 1~3 business day valid
GB/T 24579-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy 210.0 via email in 1~3 business day valid
GB/T 6619-2009 Test methods for bow of silicon wafers 180.0 via email in 1~3 business day valid
GB/T 14863-2013 Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes 200.0 via email in 1~3 business day valid
GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge 150.0 via email in 1~3 business day valid
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal 150.0 via email in 1~3 business day valid
GB/T 29505-2013 Test method for measuring surface roughness on planar surfaces of silicon wafer 430.0 via email in 1~3 business day valid
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