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Position: Chinese Standard in English/GB/T 1550-1997
GB/T 1550-1997   methods for measuring conductivity type of extrinsic semiconducting materials (English Version)
Standard No.: GB/T 1550-1997 Status:superseded remind me the status change

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Target Language:English File Format:PDF
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Implemented on:1997-1-2 Delivery: via email in 1~3 business day

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,2019-11-1,1997-1-2,141138133465470CA8ECB85446563
Standard No.: GB/T 1550-1997
English Name: methods for measuring conductivity type of extrinsic semiconducting materials
Chinese Name: 非本征半导体材料导电类型测试方法
Chinese Classification: H21    Metal physical property test method
Professional Classification: GB    National Standard
ICS Classification: 77.040.01 77.040.01    Testing of metals in general 77.040.01
Source Content Issued by: AQSIQ
Issued on: 1997-6-3
Implemented on: 1997-1-2
Status: superseded
Superseded by:GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
Superseded on:2019-11-1
Superseding:GB 5256-1985 锗单晶导电类型测量方法
Target Language: English
File Format: PDF
Word Count: 4000 words
Translation Price(USD): 120.0
Delivery: via email in 1~3 business day
本标准规定了非本征半导体材料导电类型的测定方法。本标准适用于非本征半导体材料导电类型的测定,其中较详细地规定了锗和硅导电类型的测试方法。本标准方法能保证对均匀的同一导电类型的材料测得的可靠结果,对于非均匀试样,可在其表面上测出不同导电类型区域。本标准方法不适用于分层结构试样,如外延片的导电类型的测定。
GB/T 1550-1997 is referred in:
* GB/T 12963-2009 Specification for Polycrystalline Silicon
* GB/T 12963-2009 Specification for Polycrystalline Silicon
Code of China
Standard
GB/T 1550-1997  methods for measuring conductivity type of extrinsic semiconducting materials (English Version)
Standard No.GB/T 1550-1997
Statussuperseded
LanguageEnglish
File FormatPDF
Word Count4000 words
Price(USD)120.0
Implemented on1997-1-2
Deliveryvia email in 1~3 business day
Detail of GB/T 1550-1997
Standard No.
GB/T 1550-1997
English Name
methods for measuring conductivity type of extrinsic semiconducting materials
Chinese Name
非本征半导体材料导电类型测试方法
Chinese Classification
H21
Professional Classification
GB
ICS Classification
Issued by
AQSIQ
Issued on
1997-6-3
Implemented on
1997-1-2
Status
superseded
Superseded by
GB/T 1550-2018 Test methods for conductivity type of extrinsic semiconducting materials
Superseded on
2019-11-1
Abolished on
Superseding
GB 5256-1985 锗单晶导电类型测量方法
Language
English
File Format
PDF
Word Count
4000 words
Price(USD)
120.0
Keywords
GB/T 1550-1997, GB 1550-1997, GBT 1550-1997, GB/T1550-1997, GB/T 1550, GB/T1550, GB1550-1997, GB 1550, GB1550, GBT1550-1997, GBT 1550, GBT1550
Introduction of GB/T 1550-1997
本标准规定了非本征半导体材料导电类型的测定方法。本标准适用于非本征半导体材料导电类型的测定,其中较详细地规定了锗和硅导电类型的测试方法。本标准方法能保证对均匀的同一导电类型的材料测得的可靠结果,对于非均匀试样,可在其表面上测出不同导电类型区域。本标准方法不适用于分层结构试样,如外延片的导电类型的测定。
Contents of GB/T 1550-1997
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Keywords:
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