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| Position: Chinese Standard in English/GB/T 20726-2006 |
| GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors (English Version) | |||
| Standard No.: | GB/T 20726-2006 | Status: | superseded remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 4000 words | Price(USD): | 120.0 remind me the price change |
| Implemented on: | 2007-8-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 20726-2006 |
| English Name: | Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors |
| Chinese Name: | 半导体探测器X射线能谱仪通则 |
| Chinese Classification: | N33 Electron optics and other physical optics instrument |
| Professional Classification: | GB National Standard |
| ICS Classification: | 71.040.99 Other standards related to analytical chemistry |
| Issued by: | AQSIQ, SAC |
| Issued on: | 2006-12-25 |
| Implemented on: | 2007-8-1 |
| Status: | superseded |
| Superseded by: | GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis |
| Superseded on: | 2016-9-1 |
| Language: | English |
| File Format: | |
| Word Count: | 4000 words |
| Price(USD): | 120.0 |
| Delivery: | via email in 1~3 business day |