Standard No.:	GB/T 20726-2015
English Name:	Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
Chinese Name:	微束分析 电子探针显微分析X射线能谱仪主要性能参数及核查方法
Chinese Classification:	G04    Basic standards and general methods
Professional Classification:	GB    National Standard
ICS Classification:	71.040.99 71.040.99    Other standards related to analytical chemistry 71.040.99
Source Content Issued by:	AQSIQ; SAC
Issued on:	2015-10-09
Implemented on:	2016-9-1
Status:	to be superseded
Superseded by:	GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
Superseded on:	2026-3-1
Superseding:	GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
Target Language:	English
File Format:	PDF
Word Count:	7500 words
Translation Price(USD):	80.0
Delivery:	via email in 1~3 business day

本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X-射线能谱仪（EDS）特性最重要的性能参数。本标准仅适用基于固态电离原理的半导体探测器能谱仪。本标准规定了与扫描电镜（SEM）或电子探针（EPMA）联用的EDS性能参数的最低要求以及核查方法。至于实际分析过程，在ISO 22309和 ASTM E1508 中已有规范，不在本标准范围之内。