 |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
| Position: Chinese Standard in English/GB/T 24577-2009 |
| GB/T 24577-2009 Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography (English Version) | |||
| Standard No.: | GB/T 24577-2009 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 7000 words | Translation Price(USD): | 210.0 remind me the price change |
| Implemented on: | 2010-6-1 | Delivery: | via email in 1~3 business day |
| → | → | → |
| Standard No.: | GB/T 24577-2009 |
| English Name: | Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography |
| Chinese Name: | 热解吸气相色谱法测定硅片表面的有机污染物 |
| Chinese Classification: | H80 Semimetal and semiconductor material in general |
| Professional Classification: | GB National Standard |
| ICS Classification: | 29.045 Semiconducting materials |
| Source Content Issued by: | AQSIQ;SAC |
| Issued on: | 2009-10-30 |
| Implemented on: | 2010-6-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 7000 words |
| Translation Price(USD): | 210.0 |
| Delivery: | via email in 1~3 business day |