 |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
LoginRegister |
| Position: Chinese Standard in English/GB/T 24581-2022 |
| GB/T 24581-2022 Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method (English Version) | |||
| Standard No.: | GB/T 24581-2022 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 5500 words | Price(USD): | 165.00 remind me the price change |
| Implemented on: | 2022-10-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 24581-2022 |
| English Name: | Test method for Ⅲ and Ⅴ impurities content in single crystal silicon—Low temperature FT-IR analysis method |
| Chinese Name: | 硅单晶中III、V族杂质含量的测定 低温傅立叶变换红外光谱法 |
| Chinese Classification: | H17 Semimetal and semiconductor material analysis method |
| Professional Classification: | GB National Standard |
| Issued by: | SAMR; SAC |
| Issued on: | 2022-03-09 |
| Implemented on: | 2022-10-1 |
| Status: | valid |
| Superseding: | GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities |
| Language: | English |
| File Format: | |
| Word Count: | 5500 words |
| Price(USD): | 165.00 |
| Delivery: | via email in 1~3 business day |