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Position: Chinese Standard in English/GB/T 4060-2007
GB/T 4060-2007   Polycrystalline silicon—Examination method—Vacuum zone-melting on boron (English Version)
Standard No.: GB/T 4060-2007 Status:superseded
Language:English File Format:PDF
Word Count: 4000 words Price(USD):120.00 remind me the price change
Implemented on:2008-2-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 4060-2007
English Name: Polycrystalline silicon—Examination method—Vacuum zone-melting on boron
Chinese Name: 硅多晶真空区熔基硼检验方法
Chinese Classification: H17    Semimetal and semiconductor material analysis method
Professional Classification: GB    National Standard
ICS Classification: 77.040.01 77.040.01    Testing of metals in general 77.040.01
Issued by: AQSIQ;SAC
Issued on: 2007-12-18
Implemented on: 2008-2-1
Status: superseded
Superseded by:GB/T 4060-2018 Test method for boron content in polycrystalline silicon by vacuum zone-melting method
Superseded on:2019-6-1
Superseding:GB/T 4060-1983 Polycrystalline silicon; Examination method; Vacuum zone-melting on boron
Language: English
File Format: PDF
Word Count: 4000 words
Price(USD): 120.00
Delivery: via email in 1~3 business day
GB/T 4060-2007 is referred in:
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