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| Position: Chinese Standard in English/GB/T 4060-2007 |
| GB/T 4060-2007 Polycrystalline silicon—Examination method—Vacuum zone-melting on boron (English Version) | |||
| Standard No.: | GB/T 4060-2007 | Status: | superseded |
| Language: | English | File Format: | |
| Word Count: | 4000 words | Price(USD): | 120.00 remind me the price change |
| Implemented on: | 2008-2-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 4060-2007 |
| English Name: | Polycrystalline silicon—Examination method—Vacuum zone-melting on boron |
| Chinese Name: | 硅多晶真空区熔基硼检验方法 |
| Chinese Classification: | H17 Semimetal and semiconductor material analysis method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 77.040.01 Testing of metals in general |
| Issued by: | AQSIQ;SAC |
| Issued on: | 2007-12-18 |
| Implemented on: | 2008-2-1 |
| Status: | superseded |
| Superseded by: | GB/T 4060-2018 Test method for boron content in polycrystalline silicon by vacuum zone-melting method |
| Superseded on: | 2019-6-1 |
| Superseding: | GB/T 4060-1983 Polycrystalline silicon; Examination method; Vacuum zone-melting on boron |
| Language: | English |
| File Format: | |
| Word Count: | 4000 words |
| Price(USD): | 120.00 |
| Delivery: | via email in 1~3 business day |