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| Position: Chinese Standard in English/GB/T 43087-2023 |
| GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials (English Version) | |||
| Standard No.: | GB/T 43087-2023 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 20500 words | Price(USD): | 700.00 remind me the price change |
| Implemented on: | 2024-4-1 | Delivery: | via email in 1~5 business day |
| Standard No.: | GB/T 43087-2023 |
| English Name: | Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials |
| Chinese Name: | 微束分析 分析电子显微术 层状材料截面像中界面位置的确定方法 |
| Chinese Classification: | N33 Electron optics and other physical optics instrument |
| Professional Classification: | GB National Standard |
| ICS Classification: | 71.040.50 Physicochemical methods of analysis |
| Issued by: | SAMR; SAC |
| Issued on: | 2023-09-07 |
| Implemented on: | 2024-4-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 20500 words |
| Price(USD): | 700.00 |
| Delivery: | via email in 1~5 business day |