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| Position: Chinese Standard in English/GB/T 4326-2006 |
| GB/T 4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient (English Version) | |||
| Standard No.: | GB/T 4326-2006 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 7000 words | Translation Price(USD): | 210.0 remind me the price change |
| Implemented on: | 2006-11-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 4326-2006 |
| English Name: | Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient |
| Chinese Name: | 非本征半导体单晶霍尔迁移率和霍尔系数测量方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 77.040.01 Testing of metals in general |
| Source Content Issued by: | AQSIQ;SAC |
| Issued on: | 2006-7-18 |
| Implemented on: | 2006-11-1 |
| Status: | superseded |
| Superseded by: | GB/T 4326-2025 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient |
| Superseded on: | 2026-5-1 |
| Abolished on: | 2026-05-01 |
| Superseding: | GB/T 4326-1984 Extrinsic semiconductor single crystals; Measurement of Hall mobility and Hall coefficient |
| Target Language: | English |
| File Format: | |
| Word Count: | 7000 words |
| Translation Price(USD): | 210.0 |
| Delivery: | via email in 1~3 business day |