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| Position: Chinese Standard in English/GB/T 43748-2024 |
| GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips (English Version) | |||
| Standard No.: | GB/T 43748-2024 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 7500 words | Translation Price(USD): | 225.0 remind me the price change |
| Implemented on: | 2024-10-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 43748-2024 |
| English Name: | Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips |
| Chinese Name: | 微束分析 透射电子显微术 集成电路芯片中功能薄膜层厚度的测定方法 |
| Chinese Classification: | N33 Electron optics and other physical optics instrument |
| Professional Classification: | GB National Standard |
| ICS Classification: | 71.040.50 Physicochemical methods of analysis |
| Source Content Issued by: | SAMR; SAC |
| Issued on: | 2024-3-15 |
| Implemented on: | 2024-10-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 7500 words |
| Translation Price(USD): | 225.0 |
| Delivery: | via email in 1~3 business day |