Standard No.:	GB/T 46223-2025
English Name:	Microbeam analysis—Analytical electron microscopy—Method for the determination of energy resolution for electron energy loss spectrum analysis
Chinese Name:	微束分析 分析电子显微术 电子能量损失谱能量分辨率的测定方法
Chinese Classification:	N33    Electron optics and other physical optics instrument
Professional Classification:	GB    National Standard
ICS Classification:	71.040.50 71.040.50    Physicochemical methods of analysis 71.040.50
Source Content Issued by:	SAMR; SAC
Issued on:	2025-8-29
Implemented on:	2026-3-1
Status:	to be valid
Target Language:	English
File Format:	PDF
Word Count:	19000 words
Translation Price(USD):	570.0
Delivery:	via email in 1~5 business day

本文件描述了配备电子能量损失谱仪(简称“能损谱仪”,EELS)的透射电子显微镜(TEM)或扫描透射电子显微镜(STEM)中电子能量损失谱(简称“能损谱”)能量分辨率的测定程序。
本文件适用于内置型和后置型的EELS,包括采用并行检测系统和串行检测系统的谱仪。