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Position: Chinese Standard in English/YS/T 679-2008 |
YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage (English Version) | |||
Standard No.: | YS/T 679-2008 | Status: | superseded remind me the status change
Email: |
Language: | English | File Format: | |
Word Count: | 7000 words | Price(USD): | 210.0 remind me the price change
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Implemented on: | 2008-9-1 | Delivery: | via email in 1~3 business day |
Standard No.: | YS/T 679-2008 |
English Name: | Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage |
Chinese Name: | 非本征半导体中少数载流子扩散长度的稳态表面光电压测试方法 |
Chinese Classification: | H80 Semimetal and semiconductor material in general |
Professional Classification: | YS Professional Standard - Non-ferrous Metal |
ICS Classification: | 29.045 29.045 Semiconducting materials 29.045 |
Issued by: | NDRC |
Issued on: | 2008-3-12 |
Implemented on: | 2008-9-1 |
Status: | superseded |
Superseded by: | YS/T 679-2018 Test methods for minority carrier diffusion length in extrinsic semiconductors. Surface photovoltage method |
Superseded on: | 2019-4-1 |
Language: | English |
File Format: | |
Word Count: | 7000 words |
Price(USD): | 210.0 |
Delivery: | via email in 1~3 business day |
YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage (English Version) | |||
Standard No. | YS/T 679-2008 | ||
Status | superseded | ||
Language | English | ||
File Format | |||
Word Count | 7000 words | ||
Price(USD) | 210.0 | ||
Implemented on | 2008-9-1 | ||
Delivery | via email in 1~3 business day |
Standard No. |
YS/T 679-2008 |
English Name |
Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage |
Chinese Name |
非本征半导体中少数载流子扩散长度的稳态表面光电压测试方法 |
Chinese Classification |
H80 |
Professional Classification |
YS |
ICS Classification |
Issued by |
NDRC |
Issued on |
2008-3-12 |
Implemented on |
2008-9-1 |
Status |
superseded |
Superseded by |
YS/T 679-2018 Test methods for minority carrier diffusion length in extrinsic semiconductors. Surface photovoltage method |
Superseded on |
2019-4-1 |
Abolished on |
Superseding |
Language |
English |
File Format |
Word Count |
7000 words |
Price(USD) |
210.0 |
Keywords |
YS/T 679-2008, YS 679-2008, YST 679-2008, YS/T679-2008, YS/T 679, YS/T679, YS679-2008, YS 679, YS679, YST679-2008, YST 679, YST679 |
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Keywords: | ||
YS/T 679-2008, YS 679-2008, YST 679-2008, YS/T679-2008, YS/T 679, YS/T679, YS679-2008, YS 679, YS679, YST679-2008, YST 679, YST679 |