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| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | Electronic components—Long-term storage of electronic semiconductor devices—Part 2：Deterioration mechanisms |
| Chinese Title: | 电子元器件 半导体器件长期贮存 第2部分：退化机理 |
| Standard No.: | GB/T 42706.2-2023 |
| Category No.: | L40 |
| Issued by: | SAMR; SAC |
| Issued on: | 2023-05-23 |
| Implemented on: | 2023-9-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 9500 words |
| Similar Standards: |
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