 |
Chinese Classification
Professional Classification
ICS Classification
Latest
Value-added Services
|
| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | Measurement method of radiation induced traps by deep level transient spectroscopy |
| Chinese Title: | 辐射诱生缺陷的深能级瞬态谱测试方法 |
| Standard No.: | T/CIE 145-2022 |
| Category No.: | L40 |
| Issued by: | CIE |
| Issued on: | 2022-12-31 |
| Implemented on: | |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 7500 words |
| Similar Standards: |
| Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886 |
| Copyright: Beijing COC Tech Co., Ltd. 2008-2020 |