| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| GB/T 24576-2009 |
Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction |
$170.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
| GB/T 24577-2009 |
Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography |
$210.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
| GB/T 24578-2009 |
Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy |
$210.00 |
via email in 1~3 business day |
superseded,2017-1-1,2010-6-1 |
|
| GB/T 24579-2009 |
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy |
$210.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
| GB/T 24580-2009 |
Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry |
$180.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
| GB/T 24581-2009 |
Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities |
$170.00 |
via email in 1~3 business day |
superseded,2022-10-1,2010-6-1 |
|
| GB/T 24582-2009 |
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry |
$120.00 |
via email in 1~3 business day |
superseded,2024-3-1,2010-6-1 |
|
| GB/T 25075-2010 |
Gallium arsenide single crystal for solar cell |
$140.00 |
via email in 1~3 business day |
valid,,2011-4-1 |
|
| GB/T 25076-2010 |
Monocrystalline silicon of solar cell |
$180.00 |
via email in 1~3 business day |
superseded,2019-6-1,2011-4-1 |
|
| GB/T 26066-2010 |
Practice for shallow etch pit detection on silicon |
$120.00 |
via email in 1~3 business day |
valid,,2011-10-1 |
|
| GB/T 26068-2010 |
Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance |
$390.00 |
via email in 1~3 business day |
superseded,2019-11-1,2011-10-1 |
|
| GB/T 26069-2010 |
Specification for silicon annealed wafers |
$180.00 |
via email in 1~3 business day |
superseded,2022-10-1,2011-10-1 |
|
| GB/T 26071-2010 |
Mono-crystalline silicon as cut slices for photovoltaic solar cells |
$180.00 |
via email in 1~3 business day |
superseded,2019-4-1,2011-10-1 |
|
| GB/T 29057-2012 |
Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy |
$270.00 |
via email in 1~3 business day |
superseded,2024-3-1,2013-10-1 |
|
| GB/T 29057-2023 |
Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy |
$255.00 |
via email in 1~3 business day |
valid,,2024-3-1 |
|
| GB/T 29505-2013 |
Test method for measuring surface roughness on planar surfaces of silicon wafer |
$430.00 |
via email in 1~3 business day |
valid,,2014-2-1 |
|
| GB/T 29507-2013 |
Test method for measuring flatness, thickness and total thickness vsriation on silicon wafers. Automated non-contact scanning |
$260.00 |
via email in 1~3 business day |
valid,,2014-2-1 |
|
| GB/T 30110-2013 |
Measuring Methods of Parameters of Hgcdte Epilayers Used for Space Infrared Detectors |
$480.00 |
via email in 1~3 business day |
valid,,2014-5-15 |
|
| GB/T 30453-2013 |
Metallographs Collection for Original Defects of Crystalline Silicon |
$1200.00 |
via email in 1~3 business day |
valid,,2014-10-1 |
|
| GB/T 32279-2015 |
pecification for order entry format of silicon wafers |
$270.00 |
via email in 1~3 business day |
valid,,2017-1-1 |
|
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