| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| GB/T 34479-2017 |
Specification for alphanumeric marking of silicon wafers |
$210.00 |
via email in 1~3 business day |
valid,,2018-7-1 |
|
| GB/T 37051-2018 |
Test method for determination of crystal defect density in PV silicon ingot and wafer |
$160.00 |
via email in 1~3 business day |
valid,,2019-4-1 |
|
| GB/T 4058-2009 |
Test method for detection of oxidation induced defects in polished silicon wafers |
$300.00 |
immediately |
valid,,2010-6-1 |
|
| GB/T 4061-2009 |
Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion |
$80.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
| GB/T 43612-2023 |
Collection of metallographs on defects in silicon carbide crystal materials |
$735.00 |
via email in 1~5 business day |
valid,,2024-7-1 |
|
| GB/T 6616-2009 |
Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge |
$150.00 |
via email in 1~3 business day |
superseded,2024-3-1,2010-6-1 |
|
| GB/T 6617-2009 |
Test method for measuring resistivity of silicon wafer using spreading resistance probe |
$150.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
| GB/T 6618-2009 |
Test method for thickness and total thickness variation of silicon slices |
$180.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
| GB/T 6619-2009 |
Test methods for bow of silicon wafers |
$180.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
| GB/T 6621-2009 |
Testing methods for surface flatness of silicon slices |
$110.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
| GB/T 8756-2018 |
Collection of metallographs on defects of germanium crystal |
$610.00 |
via email in 1~5 business day |
valid,,2019-7-1 |
|
| YS/T 23-1992 |
Thickness determination for silicon epitaxial layers - Stacking fault method |
$60.00 |
via email in 1~3 business day |
superseded,2016-9-1,1993-1-1 |
|
| YS/T 24-1992 |
Test method for defects of extended nails |
$30.00 |
via email in 1~3 business day |
superseded,2016-9-1,1993-1-1 |
|
| YS/T 679-2008 |
Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage |
$210.00 |
via email in 1~3 business day |
superseded,2019-4-1,2008-9-1 |
|
| YS/T 838-2012 |
Cadmium Telluride |
$210.00 |
via email in 1~3 business day |
valid,,2013-3-1 |
|
| YS/T 985-2014 |
Polished reclaimed silicon wafers |
$220.00 |
via email in 1~3 business day |
valid,,2015-4-1 |
|
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* Related standard quantity: * Page quantity: *
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