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| Position: Chinese Standard in English/GB/T 1553-2009 |
| GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay (English Version) | |||
| Standard No.: | GB/T 1553-2009 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 7000 words | Translation Price(USD): | 210.0 remind me the price change |
| Implemented on: | 2010-6-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 1553-2009 |
| English Name: | Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay |
| Chinese Name: | 硅和锗体内少数载流子寿命测定光电导衰减法 |
| Chinese Classification: | H80 Semimetal and semiconductor material in general |
| Professional Classification: | GB National Standard |
| ICS Classification: | 29.045 Semiconducting materials |
| Source Content Issued by: | AQSIQ; SAC |
| Issued on: | 2009-10-30 |
| Implemented on: | 2010-6-1 |
| Status: | superseded |
| Superseded by: | GB/T 1553-2023 Test methods for minority carrier lifetime in bulk silicon and germanium—Photoconductivity decay method |
| Superseded on: | 2024-3-1 |
| Superseding: | GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay |
| Target Language: | English |
| File Format: | |
| Word Count: | 7000 words |
| Translation Price(USD): | 210.0 |
| Delivery: | via email in 1~3 business day |