Standard No.:	GB/T 24574-2009
English Name:	Test methods for photoluminescence analysis of single crystal silicon for Ⅲ-Ⅴ impurities
Chinese Name:	硅单晶中Ⅲ-Ⅴ族杂质的光致发光测试方法
Chinese Classification:	H80    Semimetal and semiconductor material in general
Professional Classification:	GB    National Standard
ICS Classification:	29.045 29.045    Semiconducting materials 29.045
Issued by:	AQSIQ;SAC
Issued on:	2009-10-30
Implemented on:	2010-6-1
Status:	valid
Language:	English
File Format:	PDF
Word Count:	7000 words
Price(USD):	210.00
Delivery:	via email in 1~3 business day

本标准规定了硅单晶中Ⅲ-Ⅴ族杂质的光致发光测试方法。
本标准适用于低位错单晶硅中导电性杂质硼和磷含量的同时测定。
本标准用于检测单晶硅中含量为1×1011at·cm-3~5×1015at·cm-3的各种电活性杂质元素。