1 Scope
This part of GB/T 17626 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures.
The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon.
Note: As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria. SAC/TC 246 and its subcommittees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products.
This part specifies:
— test voltage waveform;
— range of test levels;
— test equipment;
— calibration and verification procedures of test equipment;
— test setups;
— test procedure.
This part gives specifications for laboratory and in situ tests.
2 Normative References
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
GB/T 4365-2003 Electrotechnical Terminology — Electromagnetic Compatibility (IEC 60050(161):1990, IDT)
3 Terms, Definitions and Abbreviations
3.1 Terms and Definitions
For the purposes of this document, the terms and definitions of GB/T 4365-2003, as well as the following apply.
3.1.1
auxiliary equipment; AE
equipment necessary to provide the equipment under test (EUT) with the signals required for normal operation and equipment to verify the performance of the EUT
3.1.2
burst
sequence of a limited number of distinct pulses or an oscillation of limited duration
[GB/T 4365-2003, Definition 2.2]
Foreword II
1 Scope
2 Normative References
3 Terms, Definitions and Abbreviations
3.1 Terms and Definitions
3.2 Abbreviations
4 General
5 Test Levels
6 Test Equipment
6.1 Overview
6.2 Burst Generator
6.3 Coupling/Decoupling Network for a.c./d.c. Power Port
6.4 Capacitive Coupling Clamp
7 Test Setup
7.1 General
7.2 Test Equipment
7.3 Test Setup for Type Tests Performed in Laboratories
7.4 Test Setup for In-situ Tests
8 Test Procedure
8.1 General
8.2 Laboratory Reference Conditions
8.3 Execution of the Test
9 Evaluation of Test Results
10 Test Report
Annex A (Informative) Information on the Electrical Fast Transients
Annex B (Informative) Selection of the Test Levels
Annex C (Informative) Measurement Uncertainty (MU) Considerations
Bibliography
1 Scope
This part of GB/T 17626 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures.
The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon.
Note: As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria. SAC/TC 246 and its subcommittees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products.
This part specifies:
— test voltage waveform;
— range of test levels;
— test equipment;
— calibration and verification procedures of test equipment;
— test setups;
— test procedure.
This part gives specifications for laboratory and in situ tests.
2 Normative References
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
GB/T 4365-2003 Electrotechnical Terminology — Electromagnetic Compatibility (IEC 60050(161):1990, IDT)
3 Terms, Definitions and Abbreviations
3.1 Terms and Definitions
For the purposes of this document, the terms and definitions of GB/T 4365-2003, as well as the following apply.
3.1.1
auxiliary equipment; AE
equipment necessary to provide the equipment under test (EUT) with the signals required for normal operation and equipment to verify the performance of the EUT
3.1.2
burst
sequence of a limited number of distinct pulses or an oscillation of limited duration
[GB/T 4365-2003, Definition 2.2]
Contents of GB/T 17626.4-2018
Foreword II
1 Scope
2 Normative References
3 Terms, Definitions and Abbreviations
3.1 Terms and Definitions
3.2 Abbreviations
4 General
5 Test Levels
6 Test Equipment
6.1 Overview
6.2 Burst Generator
6.3 Coupling/Decoupling Network for a.c./d.c. Power Port
6.4 Capacitive Coupling Clamp
7 Test Setup
7.1 General
7.2 Test Equipment
7.3 Test Setup for Type Tests Performed in Laboratories
7.4 Test Setup for In-situ Tests
8 Test Procedure
8.1 General
8.2 Laboratory Reference Conditions
8.3 Execution of the Test
9 Evaluation of Test Results
10 Test Report
Annex A (Informative) Information on the Electrical Fast Transients
Annex B (Informative) Selection of the Test Levels
Annex C (Informative) Measurement Uncertainty (MU) Considerations
Bibliography
